Integrated circuit and application processor

ABSTRACT

An integrated circuit (IC) includes a plurality of intellectual properties (IPs), each of the plurality of IPs includes a test logic. A first memory controller provides user data received from at least one of the plurality of IPs to a first memory in a first operation mode. A scanner gathers debugging data from the test logics of the plurality of IPs in a second operation mode. And a second memory controller receives the debugging data from the scanner and provides the debugging data to the first memory in the second operation mode.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims the benefit of Korean Patent Application No.10-2016-0127544, filed on Oct. 4, 2016, in the Korean IntellectualProperty Office, the disclosure of which is incorporated herein in itsentirety by reference.

BACKGROUND

The disclosure relates to a semiconductor device, and more particularly,to an integrated circuit (IC) configured to gather and store debuggingdata, an application processor (AP), and an electronic device includingthe AP.

With an increase in the integration density of semiconductor chips, itwould take much time and a lot of resources to test the semiconductorchips. A Design For Testability (DFT) technique has widely been used tomaintain the quality of semiconductor chips and increase testingefficiency. A scan test technique may occupy a large part of the DFTtechnique. By using the scan test technique, errors in hardware and/orsoftware of a System on Chip (SoC) may be debugged through a scandumpmethod.

SUMMARY

The disclosure provides an integrated circuit (IC) configured to gatherdebugging data, for detecting an error occurrence region and correctingerrors, and store the debugging data without using an external apparatuswhen an operational defect occurs.

According to an aspect of the disclosure, there is provided an ICincluding a plurality of intellectual properties (IPs), each of theplurality of IPs includes a test logic. A first memory controllerprovides user data received from at least one of the plurality of IPs toa first memory in a first operation mode. A scanner gathers debuggingdata from the test logics of the plurality of IPs in a second operationmode. And a second memory controller receives the debugging data fromthe scanner and provides the debugging data to the first memory in thesecond operation mode.

According to another aspect of the disclosure, there is provided an ICincluding a plurality of IPs, each of the plurality of IPs includes ascan chain. A bus transmits data between the plurality of IPs. Abuilt-in scanner gathers scan data from the scan chain and transmits thescan data to a memory. A controller controls at least some of theplurality of IPs and the built-in scanner to enter a scan mode, inresponse to a scan request signal, and provides scan information to thebuilt-in scanner.

According to another aspect of the disclosure, there is provided anapplication processor (AP) mounted on an electronic device including amemory. The AP includes a plurality of function blocks, each functionblock including a test logic. A controller outputs a scan mode signal,indicating an operation mode for gathering debugging data, and a scancontrol signal when an operational defect occurs in at least some of theplurality of functional blocks. A built-in scanner gathers the debuggingdata from the test logics included in the at least some function blocks,in response to the scan mode signal and the scan control signal, andtransmits the gathered debugging data to the memory.

According to another aspect of the disclosure, there is provided anintegrated circuit having a plurality of isolatable circuit devices thatoperate independently of one another. Each of the isolatable circuitdevices includes self-testing circuitry. A debugging scanner circuitreceives debugging data from the self-testing circuitry of a selectedisolatable circuit device. And a memory controller stores the debuggingdata received by the debugging scanner circuit in a predeterminedlocation of a memory device.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments of the disclosure will be more clearly understood from thefollowing detailed description taken in conjunction with theaccompanying drawings in which:

FIG. 1 is a block diagram of an electronic system according to anembodiment;

FIG. 2 is a flowchart of an operation of an integrated circuit (IC) in ascan mode, according to an embodiment;

FIG. 3 is a diagram of an example of a scan chain including a testlogic;

FIG. 4A is a block diagram of an IC according to an embodiment;

FIG. 4B is a flowchart of an operation of the IC shown in FIG. 4A;

FIG. 5A is a block diagram of an IC according to an embodiment;

FIG. 5B is a flowchart of an operation of the IC shown in FIG. 5A;

FIG. 6 is a block diagram showing relationships between a controller andother components, according to an embodiment;

FIG. 7 is a block diagram of a memory interface according to anembodiment;

FIG. 8 is a block diagram of an IC according to an embodiment;

FIG. 9 is a block diagram of an IC according to an embodiment;

FIG. 10 is a block diagram of an IC according to an embodiment;

FIG. 11 is a flowchart of an operation of an electronic system accordingto an embodiment;

FIGS. 12A to 12C are block diagrams of an electronic device according toan embodiment;

FIG. 13 is a block diagram of an electronic device according to anembodiment; and

FIG. 14 is a block diagram of an application processor (AP) and anelectronic device including the AP, according to an embodiment.

DETAILED DESCRIPTION OF THE EMBODIMENTS

FIG. 1 is a block diagram of an electronic system 1000 according to anembodiment.

The electronic system 1000 may be mounted on an electronic device, suchas a laptop computer, a smartphone, a tablet PC, a personal digitalassistant (PDA), an enterprise digital assistant (EDA), a digitalcamera, a portable multimedia player (PMP), a portable navigation device(PND), a handheld game console, a mobile internet device (MID), amultimedia device, a wearable computer, an internet of things (IoT)device, an internet of everything (IoE) device, or an e-book.

Referring to FIG. 1, the electronic system 1000 may include anintegrated circuit (IC) 10 and a memory 20. In addition, the electronicsystem 1000 may further include various types of components, such as acamera module, a display module, or a communication module.

In the electronic system 1000 according to the present embodiment, whena defect occurs in operation of the electronic system 1000 or when adefect occurs in operations of at least some of a plurality ofintellectual properties (IPs) (e.g., first to fourth IPs IP1 to IP4) anda memory interface MIF included in the IC 10, a built-in scanner 200included in the IC 10 may gather debugging data from all or some of theplurality of IPs IP1 to IP4 and the memory interface MIF, and adebugging-dedicated memory controller (e.g., the second memorycontroller 300) may store the debugging data in the memory 20. Thedebugging data may be used for a debugging operation of detecting anerror occurrence region and correcting errors. In an embodiment, thedebugging data may be state values of registers included in the IPs IP1to IP4 and the memory interface MIF. The debugging data may be scan dataSCDATA output by a scan chain formed by the registers along with testlogics TL. In other words, the debugging data may be a snapshot of a IP.However, the disclosure is not limited thereto, and the debugging datamay be various kinds of data indicating operation states of the IPs IP1to IP4 and the memory interface MIF. Hereinafter, scan data SCDATA willbe described as an example of debugging data for brevity.

The IC 10 may control an operation of the electronic system 1000. Insome embodiments, the IC 10 may refer to a system on chip (SoC), anapplication processor (AP), a mobile AP, or a control chip.

The IC 10 may include a plurality of IPs (e.g., first to fourth IPs IP1to IP4), a memory interface MIF, and a controller 100, and the memoryinterface MIF may include a first memory controller 610, a built-inscanner 200, and a second memory controller 300. Although FIG. 1illustrates a case in which the built-in scanner 200 and the secondmemory controller 300 are located in the memory interface MIF, thedisclosure is not limited thereto. The built-in scanner 200 and thememory controller 300 may be provided apart from the memory interfaceMIF.

Each of the IPs may be a function block integrated in the IC 10 and mayinclude at least one of a central processing unit (CPU), a graphicsprocessing unit (GPU), a processor, a microprocessor (MP), each core ofa multi-core processor, a power management unit (PMU), a clockmanagement unit (CMU), a cache-coherent interface, a system bus, amemory, a universal serial bus (USB), a peripheral componentinterconnect (PCI), a digital signal processor (DSP), a wired interface,a wireless interface, a controller, embedded software, a codec, a videomodule (e.g., a camera interface, a Joint Photographic Experts Group(JPEG) processor, and a video processor, or a mixer), athree-dimensional (3D) graphics core, an audio system, and a driver.

For example, as shown in FIG. 1, the IPs IP1 to IP4 may include at leastone of a CPU, a GPU, a cache-coherent interface, and a system bus. Thememory interface MIF may also be one of the IPs IP1 to IP4. However, thedisclosure is not limited thereto, and the number and kinds of IPs maybe variously changed.

Each of the IPs IP1 to IP4 may include a test logic TL. The test logicTL may output data indicating an operation state of the corresponding IPin a scan mode for gathering scan data SCDATA or a test mode for testingan operation of the IC 10. In this case, the scan mode may indicate anoperation mode in which the IC 10 internally gathers scan data SCDATAwithout using an external apparatus. The test mode may indicate anoperation mode in which an external apparatus provides a test inputsignal to the IC 10 and tests an operation state of the IC 10 inresponse to the input signal.

In an embodiment, each of the registers may include flip-flops. The testlogic TL may be connected to the flip-flops and form a scan chain. Thetest logic TL may output scan data SCDATA indicating state values of theregisters.

When a defect occurs in operation of the electronic system 1000 or whena defect occurs in operations of at least some of the IPs IP1 to IP4 andthe memory interface MIF, the controller 100 may control generaloperations for gathering and storing scan data SCDATA and rebooting theelectronic system 1000.

The controller 100 may be embodied by a program code for instructing thecontroller 100 to perform the above-described control operations and amicroprocessor (MP) or another processor (e.g., a CPU) configured toexecute the program code. The program code may be stored in the memory20 or an embedded memory of the IC 10. For example, when a defect occursin operation of the electronic system 1000 or when a defect occurs inoperations of at least some of the IPs IP1 to IP4 and the memoryinterface MIF, a microcontroller (MC) may load and execute a programcode and perform the above-described operations. However, the disclosureis not limited thereto, and the controller 100 may be embodied byhardware, software, or a combination thereof. In an embodiment, thecontroller 100 may be embodied by hardware, which is separated from theIPs IP1 to IP4 and the memory interface MIF.

The controller 100 may change an operation mode of the electronic system1000 to the scan mode. The controller 100 may generate a scan modesignal SMODE indicating the scan mode, in response to a defect sensesignal provided from the inside or outside of the IC 10. The controller100 may provide the scan mode signal SMODE to the IPs IP1 to IP4 and thememory interface MIF. The controller 100 may provide other controlsignals to the IPs IP1 to IP4 and the memory interface MIF. Thus, theoperation mode of the IC 10 may be changed to the scan mode.

When the IC 10 operates in a scan mode, the controller 100 may determineat least some of the IPs IP1 to IP4 and the memory interface MIF as IPs(hereinafter, referred to as target IPs) from which scan data SCDATA isto be gathered, and provide a control signal to block operations to thetarget IPs. In an embodiment, the controller 100 may determine all ofthe IPs IP1 to IP4 and the memory interface MIF as target IPs.

In addition, the controller 100 may isolate the target IP from other IPsin functional aspects. Even if any operation is performed in an isolatedIP (or circuit), operation results may not affect other IPs or circuits.In an embodiment, a plurality of IPs (or circuits) that are closelyrelated to one another in functional aspects may form a single functionblock, and the function block may be functionally isolated from otherIPs or circuits. For example, the functional isolation of the functionblock from the other IPs or circuits may be referred to as boundaryisolation. As can be seen from FIG. 1, all of the IPs IP1 to IP4 may beisolated from one another.

The controller 100 may control the built-in scanner 200 and the secondmemory controller 300 included in the memory interface MIF to gatherscan data SCDATA and store the scan data SCDATA in the memory 20. Tothis end, the controller 100 may provide scan information SIFM to thebuilt-in scanner 200 and provide memory setting information MSIFM to thesecond memory controller 300.

In addition, after the scan data SCDATA is stored in the memory 20, thecontroller 100 may control the electronic system 1000 to be rebooted orreset so that the electronic system 1000 may normally operate.

The memory interface MIF may transmit data to the memory 20 or receiveread data from the memory 20. The memory interface MIF may communicatewith other IPs through a system bus (e.g., the fourth IP IP4).

The memory interface MIF may include the first memory controller 610,the built-in scanner 200, the second memory controller 300, a test logicTL, a memory physical layer 620, and a selector 630. Also, the memoryinterface MIF may further include a plurality of function circuits(e.g., function circuits CIR1 and CIR2).

The first memory controller 610 may receive data from the memory 20 ortransmit data to the memory 20. When the IC 10 operates in a normalmode, the first memory controller 610 may receive data from other IPsthrough the system bus and transmit read data from the memory 20 toother IPs. In an operation of transmitting and receiving data, aplurality of function circuits CIR1 and CIR2 may operate.

The built-in scanner 200 and the second memory controller 300 may beembodied by a single module STM and enabled in response to a scan modesignal SMODE provided by the controller 100. When the IC 10 operates inthe scan mode, the built-in scanner 200 may gather scan data SCDATA fromthe test logic TL included in at least one of the IPs IP1 to IP4 and thememory interface MIF. The built-in scanner 200 may gather scan dataSCDATA from at least some or all of the IPs IP1 to IP4 and the memoryinterface MIF, based on scan information SIFM provided by the controller100.

The built-in scanner 200 may be point-to-point connected to each of theIPs IP1 to IP4 and the test logics TL of the memory interface MIF. Thebuilt-in scanner 200 may receive scan data SCDATA by point-to-pointconnections. The built-in scanner 200 may provide a scan input signalSIN to the test logic TL, and receive scan output data SDO from the testlogic TL in response to the scan input signal SIN. For example, the scaninput signal SIN may include a scan clock signal, scan input data, and ascan enable signal. The built-in scanner 200 may receive scan outputdata SDO from the test logic TL included in at least one of the IPs IP1to IP4 and the memory interface MIF and transmit the scan output dataSDO as scan data SCDATA to the second memory controller 200.

The built-in scanner 200 may convert a format of scan data SCDATA into aformat appropriate for a protocol of the second memory controller 300.For example, the built-in scanner 200 may gather scan data SCDATA fromother IPs through a Joint Test Action Group (JTAG) protocol. The secondmemory controller 300 may receive data through an Advanced eXtensibleInterface (AXI™) protocol. The built-in scanner 200 may convert a formatof the gathered scan data SCDATA into a format appropriate for the AXI™protocol. However, the disclosure is not limited thereto, and a protocolbetween the built-in scanner 200 and other IPs and a protocol for thesecond memory controller 300 may be variously determined.

In the present embodiment, the built-in scanner 200 may transmit thegathered scan data SCDATA to the memory 20 without using IPs thatoperate in a normal mode. In other words, the built-in scanner 200 maytransmit the scan data SCDATA to the memory 20 without using other IPs(e.g., a bus or the first memory controller 610).

To this end, the memory interface MIF may include the second memorycontroller 300 that operates in the scan mode. In the scan mode, thesecond memory controller 300 may transmit scan data SCDATA from thebuilt-in scanner 200 to the memory 20.

For example, the IPs IP1 to IP4 may include the first memory controller610 or the system bus (e.g., the fourth IP IP4). When all the IPs IP1 toIP4 are target IPs, operations of the first memory controller 610 or thesystem bus may be stopped in the scan mode. The built-in scanner 200 maytransmit scan data SCDATA to the memory 20 through the second memorycontroller 300, which is set only for the scan mode, so that the scandata SCDATA may be stably stored in the memory 20.

However, the disclosure is not limited thereto. In another embodiment,the built-in scanner 200 may transmit scan data SCDATA to the memory 20through other IPs (e.g., the system bus or the first memory controller610), as described below with reference to FIGS. 8 to 10.

The selector 630 may select one of the first memory controller 610 andthe second memory controller 300 in response to a scan mode signal SMODEand connect the selected memory controller to the memory physical layer620. For example, the selector 630 may select the second memorycontroller 300 when the scan mode signal SMODE is logic high H, andselect the first memory controller 610 when the scan mode signal SMODEis logic low L. Accordingly, the first memory controller 610 may havethe authority to control the memory physical layer 620 and the memory 20in the normal mode, and the second memory controller 300 may have theauthority to control the memory physical layer 620 and the memory 20 inthe scan mode.

The memory controller selected out of the first memory controller 610and the second memory controller 300 may set up the memory physicallayer 620 and the memory 20. For example, the selected memory controllermay reset (e.g., software-reset) a memory, set a timing parameter and amemory configuration, and perform ZQ calibration. Also, the selectedmemory controller may set a timing parameter of the memory physicallayer 620 and control a lock state and sink. Since the setting up of thememory physical layer 620 and the memory 20 by the memory controller isapparent to one of ordinary skill in the art, detailed descriptionsthereof will be omitted.

In a normal mode, the memory physical layer 620 may be set up by thefirst memory controller 610 and transmit user data UDATA received fromthe first memory controller 610 to the memory 20 or provide read datareceived from the memory 20 to the first memory controller 610. In ascan mode, the memory physical layer 620 may be set up by the secondmemory controller 300 and transmit scan data SCDATA received from thesecond memory controller 300 to the memory 20.

In the scan mode, the built-in scanner 200 may gather scan data SCDATAbased on scan information SIFM, and the second memory controller 300 mayset up the memory 20 and the memory physical layer 620 based on memorysetting information MSIFM. The built-in scanner 200 may gather scan dataSCDATA from the IPs after the second memory controller 300 finishessetting up the memory 20 and the memory physical layer 620.

Meanwhile, in the scan mode, the first memory controller 610 and thefunction circuits CIR1 and CIR2 may also correspond to target IPs. Thefirst memory controller 610 and the function circuits CIR1 and CIR2 maybe boundary-isolated from one another so as not to affect operations ofthe built-in scanner 200. The built-in scanner 200 may receive scan dataSCDATA regarding the first memory controller 610 and the plurality offunction circuits CIR1 and CIR2 from the test logic TL.

The memory 20 may be provided as a storage medium of the electronicsystem 1000. Also, the memory 20 may store scan data SCDATA provided bythe built-in scanner 200. The memory 20 may be located outside the IC10. The memory 20 may store application programs, an operating system(OS) image, and various kinds of data. The memory 20 may include amemory card, such as a multimedia card (MMC), an embedded MMC (eMMC)card, a secure digital (SD) card, a microSD card, or a universal flashstorage (UFS) card. Also, the memory 20 may include a volatile memory(e.g., dynamic random access memory (DRAM) and static random accessmemory (SRAM)), a flash memory, or a non-volatile memory (e.g.,phase-change RAM (PRAM), magnetic RAM (MRAM), resistive RAM (ReRAM), andferroelectrics RAM (FRAM)). Although the present embodiment illustratesa case in which the memory 20 is provided outside the IC 10, thedisclosure is not limited thereto. In another embodiment, the memory 20may be an embedded memory provided in the IC 10.

As described above, in the electronic system 1000 according to thepresent embodiment, when a defect occurs in operation of the electronicsystem 1000 or when a defect occurs in operations of at least some ofthe IPs IP1 to IP4 included in the IC 10, the built-in scanner 200 maygather scan data SCDATA and store the scan data SCDATA in the memory 20without using an external device. Thus, when an operational defectoccurs, the electronic system 1000 may store a snap shot (i.e., scandata SCDATA) of the IC 10 in a small amount of time without externalenvironmental restrictions, and the accuracy of the scan data SCDATA maybe improved. Also, when a debugging operation is performed by using scandata SCDATA stored in the memory 20, the time taken to reproduce adefect generation status may be reduced.

In the electronic system 1000 according to the present embodiment, thesecond memory controller 300 may store scan data SCDATA in the memory 20in the scan mode. In this case, the built-in scanner 200 may gather andstore scan data SCDATA without using the system bus (e.g., the fourth IPIP4) and the first memory controller 610. Accordingly, even if anoperational defect of the IC 10 occurs in the first memory controller610 or the system bus, the scan data SCDATA may be normally stored inthe memory 20.

FIG. 2 is a flowchart of an operation of an IC according to anembodiment. FIG. 2 is a diagram of an operation of the IC 10 shown inFIG. 1 in a scan mode. Specifically, FIG. 2 illustrates operations ofthe built-in scanner 200, the second memory controller 300, thecontroller 100, and a target IP 600. In FIG. 2, the target IP 600 refersto a target IP from which scan data SCDATA is to be gathered, among theIPs included in the IC (refer to 10 in FIG. 1). The target IP 600 mayinclude one IP or a plurality of IPs.

Referring to FIG. 2, the controller 100 may receive a scan requestsignal (S11). When an operational defect occurs in the IC 10, a scanrequest signal may be generated by a defect generation sensing circuitincluded in the IC 10 or under the control of an external device locatedoutside the IC 10, and the controller 100 may receive the scan requestsignal.

The controller 100 may generate a scan mode signal and transmit the scanmode signal to the built-in scanner 200, the second memory controller300, and the target IP 600 in response to the scan request signal (S12).The controller 100 may determine at least some of the IPs included inthe IC 10 as target IPs, and transmit a scan mode signal to the targetIPs or a function block including the target IPs.

The IC 10 may enter the scan mode in response to the scan mode signal.The built-in scanner 200 and the second memory controller 300 may enterthe scan mode (S21). Thus, a clock signal having a fixed frequency maybe provided to the second memory controller 300 and the built-in scanner200. In an embodiment, a debugging-dedicated clock generator included inthe memory interface (refer to MIF in FIG. 1) may provide the clocksignal having a fixed frequency to the second memory controller 300 andthe built-in scanner 200.

The second memory controller 300 may have the authority to control amemory physical layer and a memory and wait for an instruction from thebuilt-in scanner 200.

The target IP 600 may also enter the scan mode (S41). The application ofa function clock signal to the target IP 600 may be stopped, and thetarget IP 600 or a function block including the target IP 600 may beboundary-isolated. An operation of the target IP 600 may be stopped(S42). Thus, data indicating an operational state of the target IP 600may be stored in a register included in the target IP 600.

Thus, when the IC 10 enters the scan mode, the controller 100 maytransmit memory setting information to the second memory controller 300(S13). For example, the memory setting information may include setupinformation for setting up the memory (refer to 20 in FIG. 1) and thememory physical layer (refer to 620 in FIG. 1). The controller 100 mayalso transmit scan information SIFM to the built-in scanner 200 (S14).For example, the scan information SIFM may include information of thetarget IP 600, information regarding a test logic TL of the target IP600 (e.g., length information of a scan chain), and address informationof a region of the memory in which scan data SCDATA will be stored.Operations S13 and S14 may be performed simultaneously or in a changedorder.

The second memory controller 300 may set up a memory and a memoryphysical layer based on the memory setting information (S31). Forexample, the second memory controller 300 may reset (e.g.,software-reset) the memory, set a timing parameter and a memoryconfiguration, and perform ZQ calibration. Also, the second memorycontroller 300 may set a timing parameter of the memory physical layerand control a lock state and sink.

After the memory and the memory physical layer are set up, the secondmemory controller 300 may transmit a ready signal to the built-inscanner 200 (S32). After confirming that the second memory controller300 is ready, the built-in scanner 200 may gather scan data (S22). Thebuilt-in scanner 200 may provide a scan clock signal, a scan inputsignal, and a scan enable signal to the test logic TL included in thetarget IP 600. Scan data may be output from the test logic TL of thetarget IP 600 based on the scan clock signal, the scan input signal, andthe scan enable signal. The target IP 600 may transmit scan data to thebuilt-in scanner 200 (S43). The built-in scanner 200 may gather scandata SCDATA from a plurality of target IPs 600 (e.g., all or at leastsome of IPs including the test logic TL).

The built-in scanner 200 may transmit the gathered scan data to thesecond memory controller 300 (S23). The built-in scanner 200 maytransmit the scan data in units of a data size corresponding to apredetermined protocol to the second memory controller 300. For example,the built-in scanner 200 may convert a format of scan data into a formatappropriate for the protocol and transmit the converted scan data to thesecond memory controller 300.

The second memory controller 300 may write scan data to the memory(S33). The second memory controller 300 may write scan data to thememory providing a write command, scan data, and address information ofa region in which the scan data will be stored to the memory through amemory physical layer.

If the scan data is completely written, the memory may store the writtenscan data. For example, the memory may enter a self-refresh power downmode and store the written scan data.

If the scan data is completely written, the second memory controller 300may transmit a write done signal to the built-in scanner 200 (S34). Ifthe built-in scanner 200 receives the write done signal, the built-inscanner 200 may determine that the scan data is stored in the memory 20,and transmit a scan done signal to the controller 100 (S24).

A system reset signal may be generated in response to the scan donesignal (S15). Although FIG. 2 illustrates a case in which the controller100 generates a system reset signal, the disclosure is not limitedthereto. As described below with reference to FIGS. 5A and 5B, the PMU(refer to 400 in FIG. 5) may generate a system reset signal.Alternatively, when there is another component configured to control ageneral operation of the IC 10, the component may generate a systemreset signal.

The IC 10 may be reset in response to the system reset signal andoperate in a normal mode. The target IP 600 may perform a normaloperation (S44). In this case, the built-in scanner 200 may be disabled.For example, the built-in scanner 200 may be in an idle state (S25). Thesecond memory controller 300 may also be put into an idle state (S35).For example, when the second memory controller 300 is embodied byhardware, the controller 100 may be disabled or operate in a low-powermode. However, the disclosure is not limited thereto. When thecontroller 100 is embodied by software or a processor, the processor mayperform a normal operation.

FIG. 3 is a diagram of an example of a scan chain SCCHN including a testlogic TL.

The scan chain SCCHN may be included in a plurality of IPs (e.g., IP1 toIP4 of FIG. 4). Referring to FIG. 3, the scan chain SCCHN may include aflip-flop group FFG and a test logic TL.

The flip-flop group FFG may include a plurality of flip-flops FF. Theflip-flops FF may be scan flip-flops. The flip-flops FF may be multi-bitflip-flops. The flip-flop group FFG may constitute a register. Each ofthe flip-flops FF may exchange data with the test logic TL in responseto a scan clock signal SCK. Also, data of each of the flip-flops FF maybe shifted in response to the scan clock signal SCK. The test logic TLmay be embodied by a synchronous circuit or a nonsynchronous circuit.The test logic TL may process input data DIN or scan input data SIN andoutput output data DOUT corresponding to a processing result. The outputdata DOUT may be referred to as scan data.

Debugging data according to the present embodiment may be scan dataoutput by the above-described scan chain SCCHN. However, the disclosureis not limited thereto, and the debugging data may be various kinds ofdata indicating operation states of the IPs IP1 to IP4.

For brevity, it will be assumed that the debugging data according to thepresent embodiment is scan data.

FIG. 4A is a block diagram of an IC 10 a according to an embodiment, andFIG. 4B is a flowchart of an operation of the IC 10 a of FIG. 4A.

Referring to FIG. 4A, the IC 10 a may include a plurality of IPs (e.g.,first and second IPs IP1 and IP2), a controller 100, a built-in scanner200, a defect detector 400, and a memory 20. In an embodiment, thememory 20 may be provided outside the IC 10 a. For example, it will beassumed that the first IP IP1 is a GPU and the second IP IP2 is adisplay interface. The IC 10 a may further include other components ofthe IC 10 described with reference to FIG. 1. Descriptions provided withreference to FIG. 1 may be applied to the present embodiment.

Each of the GPU IP1 and the display interface IP2 may include a testlogic TL. As described above with reference to FIG. 3, the test logic TLmay be connected to flip-flops included in the first and second IPs IP1and IP2 to form a scan chain.

Referring to FIGS. 4A and 4B, the defect detector 400 may sense anoperational defect in the IC 10 a. If the operational defect isdetected, the defect detector 400 may provide a scan request signalReq_SC to the controller 100 (S110). The defect detector 400 may beembodied by hardware or software. In an embodiment, the defect detector400 may be embodied in the controller 100.

In an example, the defect detector 400 may include a timer. The timermay count a response time of at least one IP configured to operate inresponse to a specific command, and detect the occurrence of anoperational defect when a count value exceeds a critical value. Forexample, various IPs including the GPU IP1 and the display interface IP2may operate in response to a command to request an operation of adisplay device. The timer may count a response time of the IPs anddetect operational defects in IPs related to the IC 10 a or the displaydevice when a count value exceeds a critical value.

In another example, the defect detector 400 may sense a signal generatedby a reset button included in an electronic device in which the IC 10 ais mounted, and detect an operational defect.

In another example, the defect detector 400 may be embodied by a portionof a PMU included in the IC 10 a. The defect detector 400 may detect anoperational defect based on power consumption of IPs. For example, thedefect detector 400 may sense the occurrence of an operational defectwhen power consumption of an IP configured to operate in response to acommand is excessively high or low. In addition, the defect detector 400may be embodied by various circuits or modules.

The controller 100 may generate a scan mode signal SMODE in response toa scan request signal Req_SC (S120). The controller 100 may provide thescan mode signal SMODE to the plurality of IPs IP1 and IP2 and thebuilt-in scanner 200. The IPs IP1 and IP2 and the built-in scanner 200may enter a scan mode. For example, the built-in scanner 200 may beenabled in response to the scan mode signal SMODE. Operations of the IPsIP1 and IP2 may be stopped in response to the scan mode signal SMODE.

The controller 100 may provide scan information SIFM to the built-inscanner 200 (S130). For example, the scan information SIFM may includeinformation of a target IP, a length of a scan chain included in thetarget IP (e.g., the number of bytes of information contained in thescan chain), and address information of a storage region of the memory20 in which gathered scan data SCDATA will be stored.

The built-in scanner 200 may gather scan data SCDATA from the target IPbased on the scan information SIFM (S140). The built-in scanner 200 mayprovide a scan clock signal SCK, scan input data SIN, and a scan enablesignal SE to the test logic TL of the target IP. Data may be shifted andoutput from the flip-flop of the target IP in response to the scan clocksignal SCK. The built-in scanner 200 may receive, as the scan dataSCDATA, data (e.g., first and second output data SDO1 and SDO2) from thetest logic TL of the target IP. In an embodiment, the built-in scanner200 may convert a format of the gathered scan data SCDATA into a formatappropriate for a communication protocol with the memory 20. Thebuilt-in scanner 200 may transmit the scan data SCDATA to the memory 20(S150).

FIG. 5A is a block diagram of an IC 10 b according to an embodiment, andFIG. 5B is a flowchart of an operation of the IC 10 b of FIG. 5A.

Referring to FIG. 5A, the IC 10 b may include a plurality of IPs (e.g.,IPs IP1 and IP2), a controller 100, a built-in scanner 200, a defectdetector 400, a memory 20, a PMU 450, and a CMU 500. In an embodiment,the memory 20 may be provided outside the IC 10 b.

Since operations of the IPs IP1 and IP2, the controller 100, thebuilt-in scanner 200, the defect detector 400, and the memory 20 are thesame as described above with reference to FIG. 4A, repeated descriptionswill be omitted.

The PMU 450 may generally manage power of the IC 10 b. The PMU 450 maymanage powers of components (e.g., the IPs IP1 and IP2, the controller100, the built-in scanner 200, the defect detector 400, and the CMU 500)included in the IC 10 b. In addition, the PMU 450 may control operationsof the components included in the IC 10 b.

The CMU 500 may generate a plurality of clock signals CLKs and provideeach of the plurality of clock signals CLKs to the corresponding IP. Forexample, a first clock signal CLK1 may be provided to a CPU IP1, and asecond clock signal CLK2 may be provided to a display interface IP2.Frequencies and/or phases of the first clock signal CLK1 and the secondclock signal CLK2 may be equal or different. When the IC 10 b is in anormal mode, the CPU IP1 and the display interface IP2 may performnormal operations in response to the first and second clock signals CLK1and CLK2.

In an embodiment, the CMU 500 may provide a clock signal to the built-inscanner 200. The built-in scanner 200 may generate the scan clock signalSCK in response to the clock signal generated by the CMU 500. However,the disclosure is not limited thereto, and the built-in scanner 200 mayinclude a debugging clock generator configured to generate a scan clocksignal SCK.

Referring to FIG. 5B, the defect detector 400 may sense an operationaldefect in the IC 10 b. If the operational defect is detected, the defectdetector 400 may provide a scan request signal Req_SC to the controller100 (S210).

The controller 100 may generate a scan mode signal SMODE in response tothe scan request signal Req_SC (S220). The controller 100 may providethe scan mode signal SMODE to the IPs IP1 and IP2, the built-in scanner200, and the PMU 450.

The controller 100 may provide control information CIFM to the PMU 450(S230). For example, the control information CIFM may includeinformation of a target IP.

The PMU 450 may block an operation of the target IP (S240). For example,the PMU 450 may block an operation of the CMU 500 by controlling theclock gating of the target IP. The CMU 500 may include a plurality ofclock generators (e.g., phase locked loops (PLLs) or delay locked loops(DLLs)) configured to generate a plurality of clock signals CLKs,respectively. The PMU 450 may cut off power applied to a clock generatorconfigured to generate a clock signal provided to the target IP andcontrol the clock gating of the target IP. However, the disclosure isnot limited thereto, and the PMU 450 may block an operation of thetarget IP in various manners according to a set function of the PMU 450.

The controller 100 may provide scan information SIFM to the built-inscanner 200 (S250), and the built-in scanner 200 may gather scan dataSCDATA from a test logic TL of the target IP based on the scaninformation SIFM (S260). The built-in scanner 200 may transmit thegathered scan data SCDATA to the memory 20 (S270). Since operations S250to S270 are substantially the same as operations S130 to S150 of FIG.4B, detailed descriptions thereof will be omitted.

If the scan data SCDATA is completely gathered and stored, the built-inscanner 200 may provide a scan done signal SCDONE to the controller 100(S280). The controller 100 may inform the PMU 450 that that thecontroller 100 has received the scan done signal SCDONE. Alternatively,the PMU 450 may monitor the controller 100 and sense that the controller100 has received the scan done signal SCDONE.

The PMU 450 may generate a system reset signal (S290). Componentsincluded in the IC 10 b may be reset in response to the system resetsignal. The IC 10 b may operate in a normal mode. However, the memory20, in which the scan data SCDATA is stored, may not be reset. Thememory 20 may maintain the scan data SCDATA.

In an embodiment, the PMU 450 and the CMU 500 may also include testlogics TL. For example, the PMU 450 may include a plurality ofmanagement circuits having respective functions. In a scan mode,management circuits except at least some management circuits related toscan operations, from among the plurality of management circuitsincluded in the PMU 450, may correspond to target IPs.

FIG. 6 is a block diagram showing relationships between a controller 100and other components, according to an embodiment.

Referring to FIG. 6, the controller 100 may be embodied by software S/Wor firmware. The controller 100 may be embodied by a program code andmounted in an embedded memory 900. If the IC (refer to 10 in FIG. 1) ispowered on, the controller 100 may be executed by a processor 800. Forinstance, the processor 800 may include an MP or a CPU.

The processor 800, the built-in scanner 200, the embedded memory 900,the defect detector 400, and the PMU 450 may be embodied by hardwareH/W. An operating system (OS) and middleware may be between thecontroller 100 and other components.

FIG. 7 is a block diagram of a memory interface MIF_1 according to anembodiment.

Referring to FIG. 7, the memory interface MIF_1 may include a firstmemory controller 610, a built-in scanner 200, a second memorycontroller 300, a debugging clock generator 230, a memory physical layer620, a first selector 630, and a second selector 640. Also, the memoryinterface MIF_1 may further include a test logic TL and a plurality offunction circuits (e.g., function circuits CIR1 and CIR2). In anembodiment, the built-in scanner 200, the second memory controller 300,and the debugging clock generator 230 may be embodied by a single moduleSTM.

As compared with the memory interface MIF of FIG. 1, the memoryinterface MIF_1 of FIG. 7 may further include the second selector 640and the debugging clock generator 230. Since operations of othercomponents are similar to those described with reference to FIG. 1,detailed descriptions thereof will be omitted.

In the scan mode, the debugging clock generator 230 may generate adebugging clock signal DCLK in response to a reference clock signalprovided from outside of the IC (refer to 10 in FIG. 1).

The second selector 640 may select one of a function clock signal FCLKand a debugging clock signal DCLK in response to a scan mode signalSMODE, and provide the selected clock signal to the memory physicallayer 620. In this case, the function clock signal FCLK may be a clocksignal provided by the CMU (refer to 500 in FIG. 5A) of the IC 10. Inanother embodiment, a clock signal provided to the memory physical layer620 may be generated by an additional PLL. In this case, the secondselector 640 may have a PLL setting function.

For example, the second selector 640 may select the debugging clocksignal DCLK when the scan mode signal SMODE is logic high (H), andselect the function clock signal FCLK when the scan mode signal SMODE islogic low (L). Accordingly, in a normal mode, the memory physical layer620 may transmit user data UDATA to the memory 20 in response to thefunction block signal FCLK. Also, in a scan mode, the memory physicallayer 620 may transmit scan data SCDATA to the memory 20 in response tothe debugging clock signal DCLK.

In an embodiment, the debugging clock generator 230 may generate thescan clock signal (refer to SCK in FIG. 5A), and provide the scan clocksignal SCK to the built-in scanner 200. The built-in scanner 200 mayprovide the scan clock signal SCK to a target IP. For example, thebuilt-in scanner 200 may provide the scan clock signal SCK to the targetIP (i.e., a test logic TL of the target IP) during a period setaccording to a length of a scan chain of the target IP.

As described above, the memory interface MIF_1 and the IC including thememory interface MIF_1 according to the present embodiment may includethe debugging clock generator 230. In a scan mode, the debugging clockgenerator 230 may generate a debugging clock signal DCLK. In the scanmode, since scan data SCDATA is stored in the memory 20 in response tothe debugging clock signal DCLK, even if an operation error occurs inthe CMU 500, the scan data SCDATA may be stably stored in the memory 20.

FIG. 8 is a block diagram of an IC 10 c according to an embodiment.

Referring to FIG. 8, the IC 10 c may include a plurality of IPs (e.g.,first to fourth IPs IP1 to IP4) and a built-in scanner 200 c. It will beassumed that the third and fourth IPs IP3 and IP4 are a bus and a memoryinterface.

When the IC 10 c is in a scan mode, the built-in scanner 200 c maygather scan data SCDATA from the IPs IP1 to IP4. The built-in scanner200 c may gather the scan data SCDATA based on scan information providedby the controller (refer to 100 in FIG. 1). The built-in scanner 200 cmay be point-to-point connected to the IPs IP1 to IP4. The built-inscanner 200 c may gather the scan data SCDATA from the IPs IP1 to IP4 bypoint-to-point connections.

The built-in scanner 200 c may provide the gathered scan data SCDATA tothe first memory controller 610. In this case, the built-in scanner 200c may directly provide the scan data SCDATA to the first memorycontroller 610 without passing through a bus IP3. The first memorycontroller 610 may transmit the scan data SCDATA to the memory 20. Inother words, the built-in scanner 200 c may store the scan data SCDATAin the memory 20 through the first memory controller 610.

FIG. 9 is a block diagram of an IC 10 d according to an embodiment.

Referring to FIG. 9, the IC 10 d may include a plurality of IPs (e.g.,first to fourth IPs IP1 to IP4) and a built-in scanner 200 d. It will beassumed that the third and fourth IPs IP3 and IP4 are a bus and a memoryinterface, respectively.

In the present embodiment, the built-in scanner 200 d may be connectedto the bus IP3. The built-in scanner 200 d may also be point-to-pointconnected to the IPs IP1 to IP4. In a scan mode, the built-in scanner200 d may gather scan data SCDATA from the IPs IP1 to IP4 bypoint-to-point connections, and transmit the gathered scan data SCDATAto the memory interface IP4 through the bus IP3. The memory interfaceIP4 may transmit the scan data SCDATA to the memory 20. In other words,the built-in scanner 200 d may store the scan data SCDATA in the memory20 through the bus IP3 and the memory interface IP4.

FIG. 10 is a block diagram of an IC 10 e according to an embodiment.

Referring to FIG. 10, the IC 10 e may include a plurality of IPs and abuilt-in scanner 200 e. For example, the plurality of IPs may includefirst to third buses B1, B2, and B3, first and second cores CR1 and CR2,first to third memory interfaces MIF1, MIF2, and MIF3, a crypto moduleCM, a communication processor CP, a camera interface IF1, a displayinterface IF2, and an image signal processor (ISP). The plurality of IPsmay include test logics.

The IC 10 e may have a hierarchical bus structure. For example, as shownin FIG. 10, elements included in the IC 10 e may transmit or receivedata to or from one another through a hierarchical bus embodied by thefirst to third buses B1, B2, and B3.

In an embodiment, IPs that are closely related to one another infunctional aspects may be connected to the same bus. For example, thefirst and second cores CR1 and CR2 and the first to third memoryinterfaces MIF1, MIF2, and MIF3 that are related to the control ofgeneral operations of the IC 10 e and the storage of data may beconnected to the first bus B1. For example, the first bus B1 may be asystem bus. The crypto module CM and the communication processor CP thatare related to communication and a security function of the IC 10 e maybe connected to the second bus B2. The camera interface IF1, the displayinterface IF2, and the ISP may be connected to the third bus B3. Forexample, the second and third buses B2 and B3 may be expansion buses.However, the disclosure is not limited thereto, and connectionrelationships between IPs and buses may be variously changed inconsideration of data traffic.

The built-in scanner 200 e may be connected to the first bus B1. Thebuilt-in scanner 200 e may transmit the gathered scan data to one of thefirst to third memory interfaces MIF1, MIF2, and MIF3 through the firstbus B1. For example, the built-in scanner 200 e may transmit the scandata to the first memory interface MIF1 through the first bus B1, andthe first memory interface MIF1 may transmit the scan data to a memorycorresponding thereto. Thus, the built-in scanner 200 e may store thescan data in the memory through the first bus B1 and the first memoryinterface MIF1.

FIG. 11 is a flowchart of an operation of an electronic system accordingto an embodiment. The operation of the electronic system according tothe present embodiment may be applied to the electronic system 1000 ofFIG. 1. Also, the operation of an electronic system may be applied toelectronic systems on which the ICs 10 a, 10 b, 10 c, 10 d, and 10 e ofFIGS. 4A, 5A, and 8 to 10 are mounted.

Referring to FIG. 11, the electronic system 1000 may sense anoperational defect during a normal operation (S1). The electronic system1000 may sense an internal signal or an external signal and detect anoperational defect. For example, the IC (refer to 10 in FIG. 1) maycount a response time of at least one IP configured to perform anoperation in response to a command, and sense the occurrence of theoperational defect when a count value exceeds a critical value.Alternatively, the IC 10 may sense an operational defect due to a signaltransmission device when an operation that is predefined as amalfunction occurs. In another example, an electronic device on whichthe electronic system 1000 is mounted may include a button having areset function. When a user of the electronic device presses the button,the electronic system 1000 may sense that an operational defect hasoccurred.

The electronic system 1000 may change an operation mode to a scan mode(S2). The electronic system 1000 may be changed from a normal mode tothe scan mode. For example, the controller (refer to 100 in FIG. 1) maygenerate a scan mode signal SMODE, and the IPs IP1 to IP4 and thebuilt-in scanner (refer to 200 in FIG. 1) may enter the scan mode inresponse to the scan mode signal SMODE. Operations of the IPs IP1 to IP4may be stopped. Before the operations of the IPs IP1 to IP4 are stopped,values indicating operation states of the IPs IP1 to IP4 may be storedin registers included in the IPs IP1 to IP4.

The built-in scanner 200 may be in an inactive state (e.g., an idlestate), while the electronic system 1000 is performing a normaloperation. The built-in scanner 200 may be enabled in response to thescan mode signal SMODE.

Thereafter, the built-in scanner 200 may gather debugging data (e.g.,scan data) from the IPs IP1 to IP4 (S3). The built-in scanner 200 mayscan a test logic TL included in each of the IPs IP1 to IP4 based onscan information SIFM provided by the controller 100, and gatherdebugging data.

The built-in scanner 200 may store the gathered debugging data in amemory (S4). The built-in scanner 200 may provide a data write command,debugging data, and address information to the memory. The built-inscanner 200 may directly or indirectly access the memory (refer to 20 inFIG. 1) and store debugging data in the memory 20.

In an embodiment, operations S3 and S4 may be alternately and repeatedlyperformed. For example, the built-in scanner 200 may gather debuggingdata of a target IP in predetermined units (e.g., 64 bits) of data andstore the debugging data in the memory 20.

If the debugging data is stored in the memory 20, the electronic system1000 may be reset (S5). The IPs IP1 to IP4 may be reset and perform anormal operation. The built-in scanner 200 may be disabled. When thecontroller 100 is embodied by hardware, the controller 100 may bedisabled or operate in a low-power mode. When the controller 100 isembodied by software and a processor, the processor may perform a normaloperation.

FIGS. 12A to 12C are block diagrams of an electronic device 2000according to an embodiment. The electronic device 2000 may include an IC30 a, a memory 20, and a display device 60. In addition, the electronicdevice 2000 may further include various components. For example, whenthe electronic device 2000 is a portable terminal, the electronic device2000 may further include a lens, an image sensor, an antenna, atransceiver, a modem, a microphone, a speaker, a touch input unit,and/or various kinds of sensors.

The IC 30 a may include a CPU 310, RAM 320, a GPU 330, a PMU 340, amemory interface 350, a display controller 380, a built-in scanner 360,a controller 370, and a bus 390. In addition, the IC 30 a may furtherinclude various IPs.

The CPU 310 may generally control operations of the IC 30 a and theelectronic device 2000. The CPU 310 may control an operation of each ofthe components 320 to 380 of the IC 30 a. In an embodiment, the CPU 310may be embodied by a multi-core. The multi-core may be a singlecomputing component having two or more independent cores.

The RAM 320 may temporarily store programs, data, or instructions. Forexample, the programs and/or the data stored in the memory 20 may betemporarily stored in the RAM 320 under the control of the CPU 310 oraccording to a booting code. The RAM 320 may be embodied by DRAM orSRAM.

The GPU 330 may perform operations related to a graphics processingoperation.

The PMU 340 may manage power of each of the components 310 to 380 of theIC 30 a. Also, the PMU 340 may determine an operational status of eachof the components 310 to 380 and control an operation of each of thecomponents 310 to 380.

The memory interface 350 may generally control an operation of thememory 20 and control data exchange between each of the components 310to 380 of the IC 30 a and the memory 20. The memory interface 350 maywrite data to the memory 20 or read data from the memory 20 at therequest of the CPU 310.

The built-in scanner 360 may gather debugging data DDATA from thecomponents 310, 320, 330, 340, 350, 380, and 390 of the IC 30 a, andstore the gathered debugging data DDATA to the memory 20. As describedabove with reference to FIG. 1, the debugging data DDATA may be scandata.

When a defect occurs in operation of the IC 30 a, the controller 370 maygather and store debugging data DDATA and control a general operation ofrebooting the IC 30 a.

The display controller 380 may control an operation of the displaydevice 60 and transmit image data to the display device 60. For example,the display controller 380 may change a format of image data provided bythe GPU 330 or perform an image processing operation and transmit theimage data to the display device 60.

The components 310 to 380 of the IC 30 a may internally transmit andreceive data to and from one another through the system bus 390.

The memory 20, which is a data storage, may store an operating system(OS), various programs, and various kinds of data. The memory 20 may belocated outside the IC 30 a.

The display device 60 may display the received image data. The displaydevice 60 may be embodied by a flat panel display (FPD) or a flexibledisplay, such as a liquid crystal display (LCD), a light-emitting diode(LED) display, or an organic LED (OLED) display.

Referring to FIG. 12A, the electronic device 2000 may store thedebugging data DDATA in the memory 20 included outside the IC 30 a. Forexample, the memory 20 may be DRAM. However, the disclosure is notlimited thereto, and the memory 20 may be a non-volatile memory device(e.g., flash memory, PRAM, MRAM, ReRAM, or FeRAM).

In an embodiment, as described above with reference to FIG. 1, thebuilt-in scanner 360 may directly transmit debugging data DDATA to thememory 20. In another embodiment, the built-in scanner 360 may transmitthe debugging data DDATA to the memory 20 through the memory interface350 as described with reference to FIG. 8. Alternatively, the built-inscanner 360 may transmit the debugging data DDATA to the memory 20through the bus 390 and the memory interface 350 as described withreference to FIG. 9.

Referring to FIG. 12B, the electronic device 2000 may store debuggingdata DDATA in a memory (e.g., the RAM 320) included in the IC 30 a. Thebuilt-in scanner 360 may directly transmit debugging data DDATA to theRAM 320 or transmit the debugging data through the bus 390 so that thedebugging data DDATA may be stored in the RAM 320.

Referring to FIG. 12C, the electronic device 2000 may temporarily storethe debugging data DDATA in a memory (e.g., the RAM 320) included in theIC 30 a. After the IC 30 a is reset, the electronic device 2000 maystore the debugging data DDATA in the memory 20 located outside the IC30 a.

The built-in scanner 360 may directly transmit debugging data DDATA tothe RAM 320 or transmit the debugging data DDATA to the RAM 320 throughthe bus 390 so that the debugging data DDATA may be stored in the RAM320.

If the debugging data DDATA is stored in the RAM 320, the PMU 340 maygenerate a system reset signal. The IC 30 a may be reset in response tothe system reset signal. In this case, the RAM 320 may not be reset butmaintain the stored data. The built-in scanner 360 and the controller370 may enter an idle state. In an embodiment, when the controller 370is embodied by software, a processor (e.g., the CPU 310), or anotherprocessor, the processor may perform a normal operation.

The CPU 310 may read the debugging data DDATA from the RAM 320 and storethe debugging data DATA in the memory 20.

FIG. 13 is a block diagram of an electronic device 3000 according to anembodiment. The electronic device 3000 may include an IC 30 b, a storage50, and a display device 60.

The IC 30 b may include a CPU 310, RAM 320, a GPU 330, a PMU 340, astorage interface 355, a display controller 380, a built-in scanner 360,a controller 370, and a bus 390.

The storage interface 355 may generally control operations of thestorage 50 and write data to the storage 50 or read data from thestorage 50 at the request of the CPU 310.

The storage 50, which is a data storage, may store a large amount ofdata. The storage 50 may be located outside the IC 30 a. In anembodiment, the storage 50 may be easily detached from the electronicdevice 3000. For example, the storage 50 may include at least one of amemory card, a solid-state drive (SSD), a USB memory, and a hard diskdrive (HDD).

The electronic device 3000 according to the present embodiment may storedebugging data DDATA in the storage 50 located outside the IC 30 b. Thebuilt-in scanner 360 may directly transmit the debugging data DDATA tothe storage 50 or transmit the debugging data DDATA to the storagedevice 50 through the storage interface 355 and/or the bus 390 so thatthe debugging data DDATA may be stored in the storage 50.

FIG. 14 is a block diagram of an AP 40 and an electronic device 4000including the AP, according to an embodiment.

Referring to FIG. 14, the electronic device 4000 may include an AP 40, amemory 20, and an RF chip 70. In addition, the electronic device 3000may further include various components.

The AP 40 may be embodied by a System on Chip (SoC) and include a CPU410, a GPU 420, RAM 430, a PMU 440, a memory interface 450, a modem 480,a built-in scanner 460, a controller 470, and a bus 490. In addition,the AP 40 may further include various IPs. The AP 40 may be referred toas a ModAP because functions of a modem chip are integrated in the AP40.

The modem 480 may convert data to be transmitted into data appropriatefor wireless environments to enable wireless communication, and restorereceived data. The modem 480 may perform digital communication with theRF chip 70 located outside the electronic device 4000.

The RF chip 70 may receive a high-frequency signal via an antenna,convert the high-frequency signal into a low-frequency signal, andtransmit the low-frequency signal to the modem 480. Also, the RF chip 70may receive a low-frequency signal from the modem 480, convert thelow-frequency signal into a high-frequency signal, and transmit thehigh-frequency signal to the outside of the electronic device 400 viathe antenna. Also, the RF chip 70 may amplify or filter signals.

In a scan mode, the built-in scanner 460 included in the AP 40 maygather debugging data DDATA from components 410, 420, 430, 440, 450,480, and 490 of the AP 40 and store the debugging data DDATA in a memorylocated inside or outside the AP 40. For example, the built-in scanner460 may store the debugging data DDATA in the memory 20 located outsidethe AP 40 or stored in the RAM 420 included in the AP 40 or a registerfile including flip-flops.

The modem 480 may be designed to be appropriate for wirelessenvironments (e.g., a wireless communication method) of a region inwhich the electronic device 4000 is used. When the region in which theelectronic device 4000 is used is far from a region in whichenvironments capable of debugging the AP 40 (e.g., ModAP) including themodem 480 are prepared, it may not be easy to debug the AP 40. However,the electronic device 4000 according to the present embodiment maygather debugging data DDATA and store the gathered debugging data DDATAwithout using an external debugger. Thus, the accuracy of the debuggingdata DDATA may be improved, and the reproduction of a defect generationstatus and a debugging operation may be facilitated.

As is traditional in the field, embodiments may be described andillustrated in terms of blocks which carry out a described function orfunctions. These blocks, which may be referred to herein as units ormodules or the like, are physically implemented by analog and/or digitalcircuits such as logic gates, integrated circuits, microprocessors,microcontrollers, memory circuits, passive electronic components, activeelectronic components, optical components, hardwired circuits and thelike, and may optionally be driven by firmware and/or software. Thecircuits may, for example, be embodied in one or more semiconductorchips, or on substrate supports such as printed circuit boards and thelike. The circuits constituting a block may be implemented by dedicatedhardware, or by a processor (e.g., one or more programmedmicroprocessors and associated circuitry), or by a combination ofdedicated hardware to perform some functions of the block and aprocessor to perform other functions of the block. Each block of theembodiments may be physically separated into two or more interacting anddiscrete blocks without departing from the scope of the disclosure.Likewise, the blocks of the embodiments may be physically combined intomore complex blocks without departing from the scope of the disclosure.

While the disclosure has been particularly shown and described withreference to embodiments thereof, it will be understood that variouschanges in form and details may be made therein without departing fromthe spirit and scope of the following claims.

What is claimed is:
 1. An integrated circuit comprising: a plurality ofintellectual properties (IPs), each of the plurality of IPs comprises atest logic; a bus configured to be connected to the plurality of IPs; afirst memory controller configured to control a first memory, receivedata from at least one of the plurality of IPs through the bus, andprovide the data to the first memory in a first operation mode; ascanner configured to gather debugging data from at least one of thetest logics of the plurality of IPs in a second operation mode; and asecond memory controller configured to control the first memory, receivethe debugging data from the scanner and provide the debugging data,received from the scanner, to the first memory in the second operationmode, wherein the scanner is connected to each of the plurality of IPs.2. The integrated circuit of claim 1, further comprising a controllerconfigured to provide a control signal indicating the second operationmode to the plurality of IPs and the scanner, in response to a scanrequest signal.
 3. The integrated circuit of claim 2, further comprisinga defect detector configured to detect a defect in operation of theintegrated circuit and generate the scan request signal.
 4. Theintegrated circuit of claim 2, wherein the controller provides scaninformation, for gathering the debugging data, to the scanner.
 5. Theintegrated circuit of claim 4, wherein the scan information comprises atleast one of target IP information for gathering the debugging data,test logic information of a target IP, and address information regardinga region of the first memory in which the debugging data will be stored.6. The integrated circuit of claim 1, further comprising: a debuggingclock generator configured to generate a debugging clock signal in thesecond operation mode, wherein the debugging data output by the secondmemory controller is transmitted to the first memory in response to thedebugging clock signal.
 7. The integrated circuit of claim 6, whereinthe debugging clock generator generates the debugging clock signal inresponse to a reference clock signal provided from outside.
 8. Theintegrated circuit of claim 6, wherein in the first operation mode, thescanner, the second memory controller, and the debugging clock generatorare in an idle state.
 9. The integrated circuit of claim 1, wherein:each test logic constitutes a scan chain along with a plurality of scanflip-flops, and the debugging data comprises scan data output by thescan chain.
 10. The integrated circuit of claim 9, wherein the scannerprovides a scan clock signal corresponding to a length of the scan chainto the test logic included in at least one target IP included in theplurality of IPs.
 11. The integrated circuit of claim 1, wherein thescanner converts a format of the debugging data into a format of dataappropriate for a protocol of the second memory controller.
 12. Theintegrated circuit of claim 1, wherein the first memory is included inthe integrated circuit.
 13. The integrated circuit of claim 1, whereinthe first memory comprises dynamic random access memory (DRAM) locatedoutside the integrated circuit.
 14. The integrated circuit of claim 1,further comprising: a power management unit (PMU) configured to managepower provided to the plurality of IPs, wherein the PMU blocksapplication of a clock signal to the plurality of IPs in the secondoperation mode and generates a system reset signal when the debuggingdata is completely gathered and stored.
 15. An integrated circuitcomprising: a plurality of intellectual properties (IPs), each of theplurality of IPs comprises a scan chain; a bus configured to beconnected to the plurality of IPs; a first memory controller configuredto receive data from the plurality of IPs through the bus, transmit thedata to a memory and control the memory to store the data, in a normaloperation mode; a built-in scanner configured to gather scan data fromthe scan chain of one or more of the IPs, transmit the scan datagathered from the scan chain of the one or more IPs to the memory andcontrol the memory to store the scan data in a scan mode; and acontroller configured to control at least some of the plurality of IPsand the built-in scanner to enter the scan mode in response to a scanrequest signal, and provide scan information to the built-in scanner,wherein built-in scanner is connected to each of the plurality of IPs.16. The integrated circuit of claim 15, wherein the built-in scannercomprises a scanner configured to gather the scan data in the scan modeand a second memory controller configured to transmit the scan data tothe memory in the scan mode.
 17. The integrated circuit of claim 15,wherein: the built-in scanner stores the scan data in the memoryincluded in the integrated circuit, and after the integrated circuit isreset, at least one of the plurality of IPs reads the scan data from thememory and stores the scan data, read from the memory, in an externalmemory of the integrated circuit.
 18. The integrated circuit of claim15, wherein: each of the bus and the first memory controller comprises ascan chain, and the built-in scanner further gathers the scan data fromthe bus and the first memory controller.
 19. An application processormounted on an electronic device including a memory, the applicationprocessor comprising: a plurality of function blocks, each of theplurality of function blocks including a test logic; a controllerconfigured to output a scan mode signal, indicating an operation modefor gathering debugging data, and a scan control signal when anoperational defect occurs in at least some of the plurality offunctional blocks; and a built-in scanner configured to gather thedebugging data from the test logics included in the at least somefunction blocks, in response to the scan mode signal and the scancontrol signal, and transmit the debugging data to the memory andcontrol the memory to store the debugging data, wherein: the controllerprovides, to the built-in scanner, an address of the memory where thedebugging data will be stored, and the built-in scanner is connected toeach of the plurality of function blocks.